Courses Catalogue

Syllabus of the course: Electron Microscopy

In this web page we provide the syllabus of the course Electron Microscopy, offered by the Department of Physics.
The list of the courses offered during the current accademic year is available here.
The list of all courses offered by the Department of Physics is available here.

Code	Φ-277
Type	C
ECTS	6
Hours	4
Semester	Winter
Instructor	V. Binas
Program	Monday, 9:00-11:00, Amphitheater B Thusday, 9:00-11:00, Room 1
Web page	https://eclass.physics.uoc.gr/courses/PH277/
Goal of the course	This course on Electron Microscopy (E/M) aims to introduce students of the Physics and other departments to the basic concepts of E/M starting from basic principles of Geometric and Physical optics and extending to study and operational principles of the Scanning Electron Microscope (SEM), the Transmission Electron Microscope (TEM) and the Atomic Force Microscope (AFM), including pumping and vacuum procedures and fundamentals of image formation. It also covers the subjects of qualitative and quantitative microanalysis (ZAF method) and electron diffraction. The class is concluding with an “on-hands” lab practice of students on techniques for the preparation and observation/analysis of various inorganic and organic samples.
Syllabus	General principles: Geometric and Physical optics- Imaging-Lenses- Simple/ stereoscopic microscope- Apertures- Resolution/Airy disc. The evolution of microscope: E/M radiation-Electron waves-X-ray microscope- magnetic lenses. Existing types of E/Ms: TEM-TEM/R-STEM-SEM-EXMA Fluorescence: Electron emission and ion emission Microscopes Principles of magnetic lenses: Structure- Hysteresis- Faults- Depth of focus-Depth of field Imaging and contrast: Sample preparation- observation processing- diffraction-Mass density- absorption-apertures- noise Vacuum principles: Basic concepts- Theory of gas motion-application to pumping systems-operation of pumps- vacuum formation techniques- vacuum theory and technology- instrumentation- designing a vacuum system The TEM: Introductory principles- apertures- lenses- imaging system Cristalline structure: Bravais structures- Miller indexes- defects Electron Diffraction: Bragg’s law, Imaging and analyses- crystalline structures- structural and planar defects- thin films The SEM: Introductory- sample preparation- imaging and analysis processing- phase contrast- EBIC method- applications Introduction to Electron Microanalysis: X-rays production, spectrum, characteristic lines, analysis methods- topography- detection systems- EDS,WDS- imaging and related problems Qualitative and Quantitative microanalysis: ZAF method- Energy spectra- Kz ,Ka, Kf coefficients Applications: Lab exercises / practical “on-hand” experience on sample preparation (use of optical stereoscope/ plasma deposition) and the use of SEM / TEM
Bibliography	Course notes «Electron Microscopy» - G. Kiriakidis, V. Binas (2014) http://ph277.edu.physics.uoc.gr/files/Electron_Microscopy_Notes_VBinas2.pdf Textbooks: «Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM» - Ray Egerton (2005) «Transmission Electron Microscopy: A Textbook for Materials Science» - D.B. Williams, C.B. Carter - Plenum Press, New York, (1996)